March 6, 2017 — ON Semiconductor announced the release of a new CCD image sensor that enables video imaging under reduced X-ray dosage conditions for digital radiography.
The KAF-09001 image sensor provides the same imaging performance as the KAF-09000 used today for digital radiography image capture, but incorporates an improved output architecture that supports a high-sensitivity video mode, facilitating patient positioning while minimizing overall X-ray exposure.
With a resolution of 9 megapixels, the KAF-09001 shares the same high-sensitivity, low-noise 12 micron (µm) pixels as the existing KAF-09000. The quad-output design incorporated into the new device supports readout speeds up to 20 MHz, providing a 10x increase in full resolution frame rate and up to 10 frames per second (fps) video preview when the device is operated with 3 x 3 binning.
The KAF-09001 is available in both standard and engineering grades in a RoHS-compliant CERDIP-60 package with an integrated CuW cooling plate. The device is available with monochrome spectral sensitivity in both sealed and taped glass configurations.
For more information: www.onsemi.com